 |
 |
|
|
|
|
|
|
 |
|
|
|
|
|
[Exhibition] Semicon
Japan 2011 |
|
|
Nidec-read exhibit
our products at the
upcoming Semicon
Japan 2011, 12/7
(wed) ～9 (fri) .
For
the LED inspection,
we comply with the
whole process of
inspections as in
line. Products cover
from PSS,
three-dimensional
surface form
inspection to
two-dimensional
inspection from PSS
to packing and LED
wafer mask
inspection.
All the
products are
guaranteed high
productivity and
capacity.
Product Lineup ：
LED wafer inspection system for each assembling process
・LED wafer Mask inspection system
・LED wafer pre-process 2dimensional visual inspection system (PSS/EPI/FAB/Chip)
・LED PKG (After bonding/After molding) visual inspection system
・LED wafer 3 dimensional form inspection system
We are waiting for
your visit with our
products at the day.
Place ： Makuhari
Messe
Date ：
December 7th (wed)
～9th (fri),
2011 Booth
： L-03 (Hall 6
, Next Generation
Technology Pavilion)
Official site
： http://www.semiconjapan.org/en/ |
|
|
|
|
[Exhibition]
TPCA Show 2011 |
|
|
We would like to inform
you the notification for
TPCA 2011.
The exhibition will take
place at Taipei Nangang
Exhibition Hall,
November 9 (Wed) –
11(Fri), 2011.We will
introduce our Brand-New
product STAR REC V5 SR.Also, our fine products
such as inspection
tester and fixture are
prepared.
Products Line-up
・ PCB inspection
system = STAR REC V5/SR , STAR REC M6
・ Semiconductor
inspection system = GATS-2151 , GATS-7750
・ Tester for
embedded board = R-5800i
・ Inspection
Fixture = MEMS probe JIG , NINJA
JIG
・ Touch-panel
inspection system = NRTES-6351 ,
Specialized
tester
We are looking forward
to seeing you.
Venue：Taipei Nangang
Exhibition Hall
Period：November 9th
(wed.) ～11th (fri.）
Booth ：I724
Official site：TPCA
Show 2011 Website
|
|
|
|
| |
[Exhibition] JPCA Show 2011 |
| |
Nidec-Read Corporation will
be exhibiting JPCA Show 2011 held from June 1 (Wed) to 3
(Fri), 2011 at Tokyo Big Sight.
Products Line-up
・GATS-7712 / GATS-7721
・STAR REC M6 II WIDE
・MEMS probe fixture (movable head)
・R-5800i tester
・Visual inspection PSS/EPI Wafe AVIS-5000P
・LED package inspection system iPIS
・Touch panel inspection system
We look forward to seeing you at Nidec-Read's booth.
Venue ：Tokyo Big Sight East Hall 6
Period ：From June 1 (Wed) to 3 (Fri) , 2011
Booth ：6S-13＆6T-03
Official site ：Click the banner below.
|
| |
|
| |
Regarding Earthquake Impact |
| |
We would like to extend our
heartfelt sympathy for the families of the victims of
the devastating earthquake and ensuing tsunami that hit
northeast Japan on March 11, 2011.
Shown below is the impact to Nidec-Read Groups regarding
the earthquake.
1. Nidec-Read Employees
No casualties reported.
2. Facilities
No damage has occurred to all the facilities in
Nidec-Read Groups.
|
| |
|
| |
[Exhibition] Lighting Japan
2011 |
| |
Nidec-Read Corporation will
be exhibiting
Lighting Japan 2011 held from
January
19 (Wed) to
21(Fri), 2011 at
Tokyo Big Sight.
We look forward to seeing you at Nidec-Read’s booth.
Venue ： Tokyo Big Sight
Period ： From January 19 (Wed) to 21 (Fri) , 2011
Booth ： West 1-17
Official site ：
http://www.lightingjapan.jp/lighting/en/
Products ：
*LED PSS Surface Figure Auto Measuring System NVM-3025
*PSS/EPI Wafer Vision Inspection System ATI AVIS-5000P
*Wafer Macro AOI Vision Inspection System ATI WIS-1000
*High Accuracy Photo Mask / LED Wafer Mask Inspection System
MaskView-1000/1000S
*LED Package Vision Inspection System
|
| |
|
| |
[Exhibition] Semicon Japan 2010 |
| |
Nidec-Read Corporation will
be exhibiting
Semicon Japan 2010 held from
December
1 (Wed) to
3(Fri), 2010 at
Makuhari Messe.
We look forward to seeing you at Nidec-Read’s booth.
Venue ： Makuhari Messe
Period ： From December 1 (Wed) to 3 (Fri) , 2010
Booth ： Hall 8 Booth No. 8A-404
Hall 6 Next Generation Technology Pavilion Booth No.
L-02
Official site ：
http://www.semiconjapan.org/en/index.htm
Products ：
<Hall 8>
*Super Fine Probe for Semiconductor Wafer Test
<Hall 6 Next Generation Technology Pavilion>
*LED PSS Surface Figure Auto Measuring System NVM-3025
*PSS/EPI Wafer Vision Inspection System ATI AVIS-5000P
*Wafer Macro AOI Vision Inspection System ATI WIS-1000
*High Accuracy Photo Mask / LED Wafer Mask Inspection System
MaskView-1000/1000S
*LED Package Vision Inspection System
|
| |
|
|
[Exhibition] LED Japan 2010 |
|
Nidec-Read Corporation will
be exhibiting
LED Japan 2010 held from
September
29 (Wed) to
October 1(Fri), 2010 at
Pacifico Yokohama.
In
this show,we
will demonstrate and panel
display PSS surface shape 3D inspection
system, 2D vision inspection system
testable from PSS to packaging process,
and mask inspection system for LED
wafer, applicable for LED manufacturing
process.
We look forward to seeing
you at Nidec-Read’s booth.
Venue:
Pacifico Yokohama Exhibition Hall B
Period:
From September 29 (Wed) to October 1
(Fri) 2010
Booth:
M-09
Products:
Photo Mask / LED Wafer Mask Inspection
System：MV-1000S
LED PSS Depth / Diameter Inspection
System：NVM-3025
LED Process 2D Vision Inspection System：AVIS-5000Series
LED
Package Inspection System：iPIS-LWI600
/ LFI600
Official site:
http://www.sil-ledjapan.com/index.html
|
| |
|
|
[Exhibition] Semicon Taiwan
2010 |
|
Nidec-Read Corporation will
be exhibiting
Semicon Taiwan 2010 held from
September
8 (Wed) to
10(Fri), 2010 at Taipei World
Trade Center.
In
this show,we
will demonstrate and panel
display MEMS probes, LED vision
inspection system, and touch panel
inspection system.
We look forward to seeing
you at Nidec-Read’s booth.
Venue:
Taipei World Trade Center
Period:
From September 8 (Wed) to 10
(Fri) 2010
|
|
|
|
[Exhibition] JPCA Show 2010 |
|
Nidec-Read Corporation will
be exhibiting
JPCA Show 2010 held from
June 2 (Wed) to
4 (Fri), 2010 at Tokyo Big Sight.
In
JPCA Show 2010,we
will demonstrate inspection system
GATS-7711 for small size
semiconductor package such as FC-CSP
etc. with next-generation
MEMS probe fixture.
We will also introduce products just
before press releases such as high
speed, high efficient and
next-generation tester
R-5800 capable of embedded board
inspection.
Furthermore, we will introduce wealth of
solutions which cover visual inspection
for various things.
ATI AVIS-1800plus
for package visual inspection system
such as FC-CSP,
3D dimple inspection system to
measure via holes of inner layer boards,
3D surface figure measuring system
NV-2000 for LED sapphire boards,
visual inspection system
iSolar for solar cell and solar
wafer are exhibited.
We will also introduce
Non-contact to non-contact inspection system for flat panel
display, and
Touch panel inspection system
workable for the 4.5th generation as a
panel and video exhibition.
We look forward to seeing
you at Nidec-Read’s booth.
Venue:
Tokyo Big Sight East 4 Hall
Period:
From June 2 (Wed) to 4
(Fri) 2010
Booth:
4H-05
Official site:
Click the banner below
|
|
|
|
|
Moving Notice: Nidec-Read
(Shanghai) |
|
|
We would like to inform you
that effective Monday December 21, 2009, our subsidiary
company, Nidec-Read (Shanghai) International Trading Co.,
Ltd., will be moving to the address stated below.
Please update your records accordingly.
We look forward to your continued business and support.
New Office Information
Address: Room 1416, B/14F, Far East International
Plaza, No.317 XianXia Rd., Shanghai,
China 200051
TEL: (+86)-21-6237-0303
FAX: (+86)-21-6237-0220
Service starts: Monday, December 21, 2009
|
|
|
|
|
Nidec-Read to Establish a
Subsidiary in Thailand |
|
|
Nidec-Read Corporation (the "Company",
OSE:6833) today announced that the Company has established a
subsidiary in Thailand "Nidec-Read (Thailand) Co., Ltd.".
Outline
of Nidec-Read (Thailand)
・
Company
Name : NIDEC-READ (THAILAND) CO., LTD.
・
Location : Ticon-Logistic Park, M1, 1/4, 84/4, Moo 9, Tambol,
Bangwua, Amphur, Bangpakong, Chachoengsao, 24180, Thailand
・
Representative :
President, Michio Kaida
・
Line of
Business: Manufacturing, sales, maintenance and repairing of
PWB inspection systems and inspection fixtures
・
Date of Establishment : September 3, 2009
・
Opening of Business : November, 2009 (scheduled)
・
Fiscal Year End : March 31
・
Paid in
Capital : 18 Million Baht (about 50 Million Yen)
・
Ownership : Nidec-Read Corporation 90%, NC Industry Co.,
Ltd. 10%
|
|
|
|
|
[Exhibition] TPCA Show 2009 |
|
|
Nidec-Read Corporation will
be exhibiting TPCA Show 2009 held from
October 21 (Wed) to 23 (Fri), 2009 at
Taipei Nangang Exhibition Hall.
We will exhibit inspection
system for PWB / touch panel and AOI
system for LED / solar cells, and so on.
We look forward to seeing you at
Nidec-Read’s booth.
Venue:
Taipei Nangang Exhibition Hall
Period:
From October 21 (Wed) to 23
(Fri) 2009
Booth:
I-508
Products:
PWB inspection system---STAR REC M6,
LRM-1000
Tester for PWB inspection---R-5700
Tools for PWB inspection---Fixture ID
system, IG-Maker/Scan,
Real Time 4 Wire
Inspection
AOI system for LED / solar cells---NanoView,
iSolar
Solar Cell Tester
LuzCom's micro tubes for semiconductor
and PWB probes etc.
Touch panel inspection system
|
|
|
|
|
[Exhibition] PV Japan 2009 |
|
|
Nidec-Read Corporation will
be exhibiting PV Japan 2009 held from
June 24 (Wed) to 26 (Fri), 2009 at
Makuhari Messe.
We will exhibit "Solar Sell
Tester": a high speed solar cell
tester that inspects I-V
characteristics of solar cells and
classifies them, and Solar Cell/Wafer
AOI "iSolar": a high speed AOI that
inspects micro crack, saw mark, bow etc.
of solar cells and wafers.
We look forward to seeing you at
Nidec-Read’s booth.
Solar Cell Tester
Venue:
Makuhari Messe Hall 5
Period:
From June 24 (Wed) to 26
(Fri) 2009
Booth:
5A-506
Products:
Solar Cell Tester
Official site: Click the banner below.
|
|
|
|
|
[Exhibition] JPCA Show 2009 |
|
|
Nidec-Read Corporation will
be exhibiting JPCA Show 2009 held from
June 3 (Wed) to 5 (Fri), 2009 at
Tokyo Big Sight.
We will exhibit PWB
inspection system suitable for embedded
boards, our group company (since March
2009) LuzCom's micro tubes for
semiconductor probes, and so on.
We look forward to seeing you at
Nidec-Read’s booth.
STAR REC M6 LuzCom's micro tube
Venue:
Tokyo Big Sight East Hall 4
Period:
From June 3 (Wed) to 5
(Fri) 2009
Booth:
4H-06
Products:
PWB inspection system for embedded
boards "STAR REC M6"
LuzCom's micro tubes for semiconductor
probes etc.
Photomask inspection system
"MaskView-Z100L"
Optical 3D microscope for LED boards "NanoView"
Semiconductor bump inspection system
"ATI ASMS"
Official site: Click the banner below.
|
|
|
|
|
Nidec-Read to Make LuzCom
Consolidated Subsidiary |
|
|
Nidec-Read Corporation (the "Company",
OSE:6833) today announced that the Company has acquired
stocks of LuzCom Inc. ("LuzCom") and LuzCom has become a
consolidated subsidiary of the Company.
Outline
of LuzCom
・
Company
Name : LuzCom Inc. (http://www.luzcom.jp/)
・
Representative :
President, Kesao Kojima
・
Established
: November 13, 2000
・
Line of
Business: Development, manufacturing and sales of micro
tubes for semiconductor testing probes
・
Fiscal Year End : October 31
・
Employees : 16
・
Offices : Head Office (Hachioji city, Tokyo)
Factory (Chikugo city, Fukuoka)
・
Paid in
Capital : 100 Million Yen
・
Total Share Issued : 6,801 stocks
・
Shareholder Composition and Holding Ratio:
Nidec-Read Corporation (98.8%)
・
Recent Financial Highlights :
|
Fiscal Year Ended October 31 |
2007 |
2008 |
|
Net Sales |
96,547 |
116,965 |
|
Ordinary Income |
-30,310 |
-10,768 |
|
Total Assets |
87,248 |
91,735 |
|
Net Assets |
54,696 |
43,348 |
|
|
|
Nidec-Read to Spin off
Inspection System Operations into Wholly-owned
Subsidiary in China |
|
|
Nidec-Read
Corporation (the “Company,” OSE:6833) today announced that
the Company will separate its operations from Nidec System
Engineering (Zhejiang) Corporation, in which the Company
currently owns a 15 percent stake, to form a wholly owned
subsidiary (“Nidec-Read (Zhejiang) Corporation”)
manufacturing printed circuit board inspection systems and
associated inspection fixtures.
1. Outline
of Nidec-Read (Zhejiang) Corporation
・
Company
Name : Nidec-Read (Zhejiang) Corporation
・
Location :
Pinghu city, Zhejiang, P.R.China
・
Representative :
President, Yasuo Teshima
・
Established
: April 1, 2009 (scheduled)
・
Line of
business: Manufacture, sales, and maintenance of printed
circuit board inspection systems and inspection fixtures
・
Fiscal Year
End : December 31
・
Paid in
Capital : US$750,000
・
Ownership : 100%
owned
2. Date of
establishment: April 1, 2009
|
|
|
|
|
[Exhibition Information]
PV EXPO 2009 |
|
|
Nidec-Read Corporation will
be exhibiting PV EXPO 2009 held from
February 25 (Wed) to 27 (Fri), 2009 at
Tokyo Big Sight.
We will exhibit “Solar Cell
Tester”: a high speed solar cell
inspection tester that inspects I-V
characteristics of solar cells and
classifies them, and Solar Cell AOI “ATI
ezVision”: a high speed AOI that
inspects hue, pattern defects, and
cracks of solar cells.
We look forward to seeing you at
Nidec-Read’s booth.
Solar Cell Tester
Venue:
Tokyo Big Sight west hole
Period:
From February 25 (Wed) to 27
(Fri) 2009
Booth: PV1-52
Products: Solar Cell Tester
Solar Cell AOI “ATI ezVision”
Official site: Click the banner below.
|
|
|
|
|
[Exhibition Information]
ELECTROTEST Japan |
|
|
Nidec-Read Corporation will
be exhibiting ELECTROTEST Japan held from
January 28(Wed) to 30(Fri), 2009 at Tokyo Big
Sight.
We will exhibit “Solar Cell Tester”: a high
speed solar cell inspection tester that inspects
I-V characteristics of solar cells and
classifies them,
“IG-Maker”: an editing system of inspection data
suitable for embedded boards, and “IG-Scan”: an
inspection log analysis software.
We look forward to seeing you at Nidec-Read's
booth.
Solar Cell Tester
Venue
：
Tokyo Big Sight East Hall 3
Period
：
From January 28 (Wed) to 30 (Fri), 2009
Booth
：
West 1-44
Products
：
Solar Cell Tester
IG-Maker
IG-Scan
Official site ： Click the banner below.
|
|
|
|
|
[Exhibition Information]
SEMICON Korea 2009 |
|
|
Nidec-Read Corporation will
be exhibiting SEMICON Korea 2009 held from
January 20 (Tue) to 22 (Thur), 2009 at COEX,
Seoul, Korea.
We will exhibit “Solar Cell
Tester”: a high speed solar cell inspection
tester that inspects I-V characteristics of
solar cells and classifies them.
We look forward to seeing
you at Nidec-Read’s booth.
Solar Cell Tester
Venue
：
COEX, Seoul, Korea
Period
：
From January 20 (Tue) to 22 (Thur), 2009
Booth
：
Convention Hall Lobby (3F) 5901
Products
：
Solar Cell Tester
|
|
|
|
|
[Exhibition Information] TPCA
Show 2008 |
|
|
Nidec-Read Corporation will run a booth at TPCA Show
2008 schedule to take place in Taipei from October 22 to
October 24, 2008. We will exhibit “STAR REC M6” a
continuity inspection system for embedded boards, “ATI
AVIS-3600” an automatic optical inspection system,
“NVM-6060” a 3D surface profiler, “ a Solar Cell Tester
and more. We look forward to seeing you at Nidec-Read’s
booth.
Venue ： Taipei Nangang Exhibition
Hall
Period ： From October 22 to October 24, 2008
Booth ： J1116
Products ： Continuity Inspection System for Embedded
boards “STAR REC M6”
Automatic Optical Inspection “ATI AVIS-3600”
3D Surface Profiler “NVM-6060”
Solar Cell Tester and more.
Official site ：
http://www.tpca.org.tw/client/tpcashow/eng/index.html
|
|
|
|
|
[Exhibition Information] JPCA
Show 2008 |
|
|
Nidec-Read Corporation will run a booth at JPCA Show
2008 schedule to take place in Tokyo from June 11 to
June 13, 2008. We will exhibit “STAR REC M6” a
continuity inspection system for embedded boards,
“LSR-3230” a laser trimming system, “MaskView-1000” a
glass photomask inspection system, and more. We look
forward to seeing you at Nidec-Read’s booth.
Venue ： Tokyo Big Sight East Hall 4
Period ： From June 11 to June 13, 2008
Booth ： 4Q-01
Products ： Continuity Inspection System for Embedded
boards “STAR REC M6”
Continuity Inspection System for FC packages
“GATS-2114”
Laser Trimming System “LSR-3230”
Glass Photomask Inspection System “MaskView-1000”
Automatic Optical Inspection “ATI AVIS-3600”
4 wire fixtures
R-5700 High Speed Tester
Solar Cell Tester
3D Surface Profiler “NVR-E1000”
*NVR-E1000 is displayed at “Science and Core Technologys Pavilion”, East Hall 2.
Official site ： Click the banner below.
|
|
|
|
|
|
|
[Exhibition
Information] KPCA SHOW 2008 |
|
|
Nidec-Read Korea Corporation
will run a booth at KPCA show 2008 schedule to take
place in Seoul from April 23 to April 25, 2008.
We will exhibit a continuity
inspection system for semiconductor packages
“GATS-7711” and inspection fixture.
We look forward to seeing
you at Nidec-Read’s booth.
Venue：
ＣＯＥＸ
(Seoul)
Period：
From April 23 to April 25, 2008
Booth：
F101
Ｐroducts：
Continuity inspection system for semiconductor
packages
“GATS-7711”
Inspection fixture
Official site：
http://www.kpca-show.co.kr/index.php?lang=EN
|
|
|
|
|
|
|
High-speed, High-resolution
photomask AOI for ultra precision PCBs with 3μm line
widths. |
|
|
Faster processing, and
reduction in size, weight and thickness have been
progressively required in the market of
information-telecommunication devices such as mobile
phones, digital cameras, music players, portable
game consoles.
As a result, high quality
and reliability of photomasks, which are masters of
PCBs, are now coming very important issues.
“MaskView”
series are leading edge photomask AOI with 0.37μm max.
resolution and
offer high-speed inspection
of 1μm level defects, open and short.
MaskView-1000
|
|
|
|
|
Guide to CPCA SHOW 2008 Exhibit |
|
|
|
|
Development of a New Test System for HDI Module Boards with Twice the Processing Capacity |
|
|
The newly developed STAR REC M6, a high-speed step and repeat type open/leak test system for multilayer and build-up (HDI) boards with twice the processing capacity of earlier systems, went on sale in early October 2007.
The STAR REC M6 further refines the high-precision measuring technology used by Nidec-Read in its earlier testing systems for semiconductor package boards and printed wiring boards (electronic circuit boards). It delivers better alignment precision, higher yield rates, quicker testing speed, and reduced equipment costs. It can be combined with high-speed testers to perform high-speed four-pin testing and LCR embedded component testing. Motherboards and module boards with multiple panels, higher pin counts, and finer trace pitches are becoming more compact. The newly released STAR REC M6 is a reliable high-precision multiple bare-board test system that enables highly efficient and high-speed testing of such boards.
STAR REC M6
|
|
|
Participation in the Kansai Nomura Asset Management
Fair February 2006 |
|
|
|
|
|
|
Nidec-Read
Taiwan Corporation moved to a new company building July
2005 |
|
|
|
Nidec-Read Taiwan relocated its
factory and office to
Guei-Shan Hsiang,
Taoyuan in July 1, 2005. By integrating
the production and sales department in the new building,
the company attempts to provide more efficient service
to our customers.
Also,
latest equipments are introduced to
promote local production and other services.
|
|
|
Development of non-contact testers for semiconductor packages completed September 2004 |
|
|
|
 In September 2004, the company succeeded in developing the world's first commercially available optical probes. Nidec-Read now offers two ultrafine-pitch testing solutions for semiconductor packages, the PHE-1100 non-contact tester and a newer product, the PHE-2150.
The new testers are a refinement of a contact-type technology for testing continuity and short-circuits in semiconductor packages and printed circuit boards, in which a testing probe is placed in contact with testing electrodes on both sides of the package or board. Using optical probes, Nidec-Read succeeded in developing a revolutionary non-contact system for high-speed testing of today's increasingly finely integrated and multipolar circuit boards. The result is a device with testing speeds 10 times faster than that of conventional high-speed flying probes, providing fine-pitch testing unattainable by other probe systems.
|
|
|
|
|
| |
|
|
 |
